Media Summary: VLSI testing, National Taiwan University. In this video, I discuss what is stuck-at fault model. I further explain how to use this model to detect stuck-at-0 and stuck-at- This lecture discusses the problem of automatic test pattern generation (
7 1 Combinational Atpg Introduction - Detailed Analysis & Overview
VLSI testing, National Taiwan University. In this video, I discuss what is stuck-at fault model. I further explain how to use this model to detect stuck-at-0 and stuck-at- This lecture discusses the problem of automatic test pattern generation ( VLSI testing, National Taiwan University. FAN source code is available at
